Fault diagnosis for linear systems via multifrequency measurements

DOI10.1109/TCS.1979.1084659zbMath0409.94039MaRDI QIDQ4198644

Neeraj Sen, R. E. Saeks

Publication date: 1979

Published in: IEEE Transactions on Circuits and Systems (Search for Journal in Brave)

zbMATH Keywords

analog circuitmultifrequency measurementsfault fiagnosis for linear systems

Mathematics Subject Classification ID

Linear systems in control theory (93C05) Fault detection; testing in circuits and networks (94C12) Reliability and life testing (62N05)

Related Items (2)

A uniform approach to mixed-signal circuit test ⋮ Automatic parametric fault detection in complex analog systems based on a method of minimum node selection

This page was built for publication: Fault diagnosis for linear systems via multifrequency measurements