Optimized allocation of defect inspection capacity with a dynamic sampling strategy (Q337310): Difference between revisions
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| Property / DOI: 10.1016/j.cor.2014.06.024 / rank | |||
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| Property / cites work: Planning quality inspection operations in multistage manufacturing systems with inspection errors / rank | |||
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| Property / DOI: 10.1016/J.COR.2014.06.024 / rank | |||
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Latest revision as of 14:46, 9 December 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Optimized allocation of defect inspection capacity with a dynamic sampling strategy |
scientific article |
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Optimized allocation of defect inspection capacity with a dynamic sampling strategy (English)
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10 November 2016
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semiconductor manufacturing
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linear programming
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capacity planning
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inspections
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wafers at risk
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