Reliability analysis for devices subject to competing failure processes based on chance theory (Q1985115): Difference between revisions
From MaRDI portal
Latest revision as of 17:06, 30 July 2024
scientific article
Language | Label | Description | Also known as |
---|---|---|---|
English | Reliability analysis for devices subject to competing failure processes based on chance theory |
scientific article |
Statements
Reliability analysis for devices subject to competing failure processes based on chance theory (English)
0 references
7 April 2020
0 references
competing failure processes
0 references
shock models
0 references
uncertainty theory
0 references
uncertain variable
0 references
uncertain distribution
0 references
0 references
0 references
0 references