Burn-in considering yield loss and reliability gain for integrated circuits (Q421527): Difference between revisions
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Latest revision as of 17:03, 9 December 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Burn-in considering yield loss and reliability gain for integrated circuits |
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Burn-in considering yield loss and reliability gain for integrated circuits (English)
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14 May 2012
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reliability
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defect growth
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defect size distribution
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negative binomial defect density
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