Optimized allocation of defect inspection capacity with a dynamic sampling strategy (Q337310): Difference between revisions
From MaRDI portal
ReferenceBot (talk | contribs) Changed an Item |
Normalize DOI. |
||
| (One intermediate revision by one other user not shown) | |||
| Property / DOI | |||
| Property / DOI: 10.1016/j.cor.2014.06.024 / rank | |||
| Property / DOI | |||
| Property / DOI: 10.1016/J.COR.2014.06.024 / rank | |||
Normal rank | |||
Latest revision as of 14:46, 9 December 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Optimized allocation of defect inspection capacity with a dynamic sampling strategy |
scientific article |
Statements
Optimized allocation of defect inspection capacity with a dynamic sampling strategy (English)
0 references
10 November 2016
0 references
semiconductor manufacturing
0 references
linear programming
0 references
capacity planning
0 references
inspections
0 references
wafers at risk
0 references
