Burn-in considering yield loss and reliability gain for integrated circuits (Q421527): Difference between revisions

From MaRDI portal
Importer (talk | contribs)
Created a new Item
 
ReferenceBot (talk | contribs)
Changed an Item
 
(4 intermediate revisions by 4 users not shown)
Property / Mathematics Subject Classification ID
 
Property / Mathematics Subject Classification ID: 90B25 / rank
 
Normal rank
Property / Mathematics Subject Classification ID
 
Property / Mathematics Subject Classification ID: 62N05 / rank
 
Normal rank
Property / zbMATH DE Number
 
Property / zbMATH DE Number: 6035007 / rank
 
Normal rank
Property / zbMATH Keywords
 
reliability
Property / zbMATH Keywords: reliability / rank
 
Normal rank
Property / zbMATH Keywords
 
defect growth
Property / zbMATH Keywords: defect growth / rank
 
Normal rank
Property / zbMATH Keywords
 
defect size distribution
Property / zbMATH Keywords: defect size distribution / rank
 
Normal rank
Property / zbMATH Keywords
 
negative binomial defect density
Property / zbMATH Keywords: negative binomial defect density / rank
 
Normal rank
Property / MaRDI profile type
 
Property / MaRDI profile type: MaRDI publication profile / rank
 
Normal rank
Property / full work available at URL
 
Property / full work available at URL: https://doi.org/10.1016/j.ejor.2011.01.028 / rank
 
Normal rank
Property / OpenAlex ID
 
Property / OpenAlex ID: W1965086212 / rank
 
Normal rank
Property / cites work
 
Property / cites work: A Criterion for Burn-in that Balances Mean Residual Life and Residual Variance / rank
 
Normal rank
Property / cites work
 
Property / cites work: Burn-in by environmental shocks for two ordered subpopulations / rank
 
Normal rank
Property / cites work
 
Property / cites work: Burn-in and the performance quality measures in heterogeneous populations / rank
 
Normal rank
Property / cites work
 
Property / cites work: Optimal burn-in decision for products with an unimodal failure rate function / rank
 
Normal rank
Property / cites work
 
Property / cites work: A unified model incorporating yield, burn-in, and reliability / rank
 
Normal rank
Property / cites work
 
Property / cites work: Optimal burn-in for maximizing reliability of repairable non-series systems / rank
 
Normal rank
Property / cites work
 
Property / cites work: The Optimal Burn-in: State of the Art and New Advances for Cost Function Formulation / rank
 
Normal rank
Property / cites work
 
Property / cites work: Optimal burn-in time to minimize the cost for general repairable products sold under warranty / rank
 
Normal rank
links / mardi / namelinks / mardi / name
 

Latest revision as of 04:48, 5 July 2024

scientific article
Language Label Description Also known as
English
Burn-in considering yield loss and reliability gain for integrated circuits
scientific article

    Statements

    Identifiers