Burn-in considering yield loss and reliability gain for integrated circuits (Q421527): Difference between revisions

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+MaRDI publication profile
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+Normal rank
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+https://doi.org/10.1016/j.ejor.2011.01.028
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@@ Property / OpenAlex ID @@
+W1965086212
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+Normal rank
@@ Property / cites work @@
+A Criterion for Burn-in that Balances Mean Residual Life and Residual Variance
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+Burn-in by environmental shocks for two ordered subpopulations
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+Burn-in and the performance quality measures in heterogeneous populations
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+Optimal burn-in decision for products with an unimodal failure rate function
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+A unified model incorporating yield, burn-in, and reliability
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+Optimal burn-in for maximizing reliability of repairable non-series systems
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+The Optimal Burn-in: State of the Art and New Advances for Cost Function Formulation
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+Optimal burn-in time to minimize the cost for general repairable products sold under warranty
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@@ links / mardi / name / links / mardi / name @@
+Publication:421527