Finite difference method and analysis for three-dimensional semiconductor device of heat conduction (Q674709): Difference between revisions

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Latest revision as of 00:56, 5 March 2024

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Finite difference method and analysis for three-dimensional semiconductor device of heat conduction
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    Finite difference method and analysis for three-dimensional semiconductor device of heat conduction (English)
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    2 August 1998
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    The mathematical model of the three-dimensional semiconductor devices of heat conduction is described by a system of four quasilinear partial differential equations for initial-boundary value problems. One equation in elliptic form is for the electric potential; two equations of convection-dominated diffusion type are for the electron and hole concentration; and one heat conduction equation is for temperature. Characteristic finite difference schemes for two kinds of boundary value problems are put forward. By using thick and thin grids to form a complete set and treating the product threefold-quadratic interpolation, a variable time step method with the boundary condition, calculus of variations and the theory of prior estimates and techniques, optimal error estimates in \(L^2\) norm are derived in the approximate solutions.
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    semiconductor devices
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    heat conduction
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    finite difference schemes
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    variable time step method
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    optimal error estimates
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