Adaptive Control of Atomic Force Microscope for Surface-Proﬁle Estimation (Q5085880): Difference between revisions

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+Melnikov-based dynamical analysis of microcantilevers in scanning probe microscopy
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+Van der Pol type self-excited micro-cantilever probe of atomic force microscopy
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+Finite-Element-Based Nonlinear Modal Reduction of a Rotating Beam with Large-Amplitude Motion
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+Adaptive nonlinear control without overparametrization
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+https://doi.org/10.5890/jand.2019.09.001
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