Adaptive control of atomic force microscope for surface-profile estimation
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Publication:5085880
DOI10.5890/JAND.2019.09.001zbMATH Open1490.93062OpenAlexW2965948724MaRDI QIDQ5085880FDOQ5085880
Authors: Nyesunthi Apiwattanalunggarn 
Publication date: 30 June 2022
Published in: Journal of Applied Nonlinear Dynamics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.5890/jand.2019.09.001
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Cites Work
- Adaptive nonlinear control without overparametrization
- Finite-Element-Based Nonlinear Modal Reduction of a Rotating Beam with Large-Amplitude Motion
- Melnikov-based dynamical analysis of microcantilevers in scanning probe microscopy
- Van der Pol type self-excited micro-cantilever probe of atomic force microscopy
Cited In (6)
- Model-based topography estimation in trolling mode atomic force microscopy
- Event-driven feedback tracking and control of tapping-mode atomic force microscopy
- A robust control based solution to the sample‐profile estimation problem in fast atomic force microscopy
- Control strategies towards faster quantitative imaging in atomic force microscopy
- Adaptive trajectory control of microcantilever's tip utilised in atomic force microscopy-based manipulation
- Real-time sliding mode observer scheme for shear force estimation in a transverse dynamic force microscope
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