Adaptive control of atomic force microscope for surface-profile estimation
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Publication:5085880
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Cites work
- Adaptive nonlinear control without overparametrization
- Finite-Element-Based Nonlinear Modal Reduction of a Rotating Beam with Large-Amplitude Motion
- Melnikov-based dynamical analysis of microcantilevers in scanning probe microscopy
- Van der Pol type self-excited micro-cantilever probe of atomic force microscopy
Cited in
(6)- Real-time sliding mode observer scheme for shear force estimation in a transverse dynamic force microscope
- Model-based topography estimation in trolling mode atomic force microscopy
- Event-driven feedback tracking and control of tapping-mode atomic force microscopy
- A robust control based solution to the sample‐profile estimation problem in fast atomic force microscopy
- Control strategies towards faster quantitative imaging in atomic force microscopy
- Adaptive trajectory control of microcantilever's tip utilised in atomic force microscopy-based manipulation
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