Event-driven feedback tracking and control of tapping-mode atomic force microscopy

DOI10.1098/RSPA.2007.0016MaRDI QIDQ3531345zbMATH OpenOpenAlexFDO

Authors Sambit Misra, Mark R. Paul, Harry Dankowicz

Publication date 23 October 2008

Published in Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1098/rspa.2007.0016

zbMATH Keywords

stabilizationatomic force microscopytapping-modeOGY control

Mathematics Subject Classification ID

Discrete event control/observation systems (93C65) Adaptive or robust stabilization (93D21)

Recommendations

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Cites work

• COARSE BIFURCATION DIAGRAMS VIA MICROSCOPIC SIMULATORS: A STATE-FEEDBACK CONTROL-BASED APPROACH
• Control of chaos: methods and applications. I: Methods
• Controlling chaos
• Nonlinear dynamics as an essential tool for non-destructive characterization of soft nanostructures using tapping-mode atomic force microscopy
• Static output feedback -- a survey

Cited in

(14)

• Model-based topography estimation in trolling mode atomic force microscopy
• Robust nonlinear control of atomic force microscope via immersion and invariance
• A robust control based solution to the sample‐profile estimation problem in fast atomic force microscopy
• New control methodology of microcantilevers in atomic force microscopy
• Feedback-induced instability in tapping mode atomic force microscopy: theory and experiment
• Detecting Stability and Bifurcation Points in Control-Based Continuation for a Physical Experiment of the Zeeman Catastrophe Machine
• Continuation with Noninvasive Control Schemes: Revealing Unstable States in a Pedestrian Evacuation Scenario
• Adaptive control of atomic force microscope for surface-profile estimation
• A comparison between minimum variance control and other online compensation methods for specimen drift in transmission electron microscopy
• Phase-locked loop design applied to frequency-modulated atomic force microscope
• Control strategies towards faster quantitative imaging in atomic force microscopy
• Harnessing the transient signals in atomic force microscopy
• Adaptive trajectory control of microcantilever's tip utilised in atomic force microscopy-based manipulation
• Numerical continuation in nonlinear experiments using local Gaussian process regression

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