Event-driven feedback tracking and control of tapping-mode atomic force microscopy
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Publication:3531345
DOI10.1098/RSPA.2007.0016zbMATH Open1145.93419OpenAlexW2155929627MaRDI QIDQ3531345FDOQ3531345
Authors: Sambit Misra, Mark R. Paul, Harry Dankowicz 
Publication date: 23 October 2008
Published in: Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1098/rspa.2007.0016
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Cites Work
- Static output feedback -- a survey
- Controlling chaos
- Control of chaos: methods and applications. I: Methods
- COARSE BIFURCATION DIAGRAMS VIA MICROSCOPIC SIMULATORS: A STATE-FEEDBACK CONTROL-BASED APPROACH
- Nonlinear dynamics as an essential tool for non-destructive characterization of soft nanostructures using tapping-mode atomic force microscopy
Cited In (10)
- A robust control based solution to the sample‐profile estimation problem in fast atomic force microscopy
- New control methodology of microcantilevers in atomic force microscopy
- Feedback-induced instability in tapping mode atomic force microscopy: theory and experiment
- Detecting Stability and Bifurcation Points in Control-Based Continuation for a Physical Experiment of the Zeeman Catastrophe Machine
- Continuation with Noninvasive Control Schemes: Revealing Unstable States in a Pedestrian Evacuation Scenario
- Phase-locked loop design applied to frequency-modulated atomic force microscope
- Control strategies towards faster quantitative imaging in atomic force microscopy
- Harnessing the transient signals in atomic force microscopy
- Adaptive trajectory control of microcantilever's tip utilised in atomic force microscopy-based manipulation
- Numerical continuation in nonlinear experiments using local Gaussian process regression
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