Burn-in considering yield loss and reliability gain for integrated circuits (Q421527): Difference between revisions
From MaRDI portal
Added link to MaRDI item. |
Set profile property. |
||
| Property / MaRDI profile type | |||
| Property / MaRDI profile type: MaRDI publication profile / rank | |||
Normal rank | |||
Revision as of 00:13, 5 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Burn-in considering yield loss and reliability gain for integrated circuits |
scientific article |
Statements
Burn-in considering yield loss and reliability gain for integrated circuits (English)
0 references
14 May 2012
0 references
reliability
0 references
defect growth
0 references
defect size distribution
0 references
negative binomial defect density
0 references
