A dynamic one-dimensional interface interacting with a wall (Q1609184): Difference between revisions

The authors investigate the dynamic properties of a randomly moving interface defined on a two-dimensional square lattice. The interface cannot penetrate a wall, thus moves only in a half plane. Initially the interface is attached to the (macroscopically flat) wall. The free process (interface dynamics without wall) is well-studied. It is described by the symmetric simple exclusion process through the standard mapping where \(1/2- \eta_t(x)\) defines the local slope of the interface and \(\eta_t(x)= 0\), \(1\) is the (random) occupation number of the exclusion process at site \(x\) at time \(t\). The height of the interface thus corresponds to the integrated particle flux through the origin of the exclusion process. By comparison with this free process the authors explicitly calculate the asymptotic variance of the flux and prove upper and lower bounds for the expected height at the origin. The upper bound contains a logarithmic correction to the \(t^{1/4}\) power law of the free process which gives a lower bound. Numerical simulations indicate the relevance of this logarithmic term.