Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors (Q5286311): Difference between revisions
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Revision as of 08:59, 21 February 2024
scientific article; zbMATH DE number 223863
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors |
scientific article; zbMATH DE number 223863 |
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Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors (English)
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29 June 1993
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nondestructive optical testing technique
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stationary basic semiconductor equations
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wellposedness of the model equations
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approximate model
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