Reliability analysis for devices subject to competing failure processes based on chance theory (Q1985115): Difference between revisions
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Revision as of 05:28, 5 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Reliability analysis for devices subject to competing failure processes based on chance theory |
scientific article |
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Reliability analysis for devices subject to competing failure processes based on chance theory (English)
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7 April 2020
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competing failure processes
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shock models
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uncertainty theory
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uncertain variable
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uncertain distribution
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