Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion (Q834421): Difference between revisions
From MaRDI portal
Changed an Item |
Set profile property. |
||
Property / MaRDI profile type | |||
Property / MaRDI profile type: MaRDI publication profile / rank | |||
Normal rank |
Revision as of 01:19, 5 March 2024
scientific article
Language | Label | Description | Also known as |
---|---|---|---|
English | Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion |
scientific article |
Statements
Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion (English)
0 references
26 August 2009
0 references
ellipsoidal inclusion
0 references
eigenstrain
0 references
stress field
0 references
thin film
0 references
thickness
0 references
half-space
0 references