Parameter Identification for Semiconductor Diodes by LBIC Imaging (Q3149845): Difference between revisions
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Revision as of 17:16, 1 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Parameter Identification for Semiconductor Diodes by LBIC Imaging |
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Parameter Identification for Semiconductor Diodes by LBIC Imaging (English)
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29 September 2002
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semiconductor diodes
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laser-beam-induced-current imaging
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drift-diffusion model
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identification of parameters
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least squares
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differentiability
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