Parameter Identification for Semiconductor Diodes by LBIC Imaging
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Publication:3149845
DOI10.1137/S003613990139249XzbMath1010.35116OpenAlexW2016355805MaRDI QIDQ3149845
Kazufumi Ito, Weifu Fang, David A. Redfern
Publication date: 29 September 2002
Published in: SIAM Journal on Applied Mathematics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1137/s003613990139249x
differentiabilityleast squaresdrift-diffusion modelidentification of parameterslaser-beam-induced-current imagingsemiconductor diodes
PDEs in connection with optics and electromagnetic theory (35Q60) Inverse problems for PDEs (35R30) Nonlinear elliptic equations (35J60) PDEs with low regular coefficients and/or low regular data (35R05)
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