Parameter Identification for Semiconductor Diodes by LBIC Imaging (Q3149845)
From MaRDI portal
!
This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use the normal view instead:
scientific article; zbMATH DE number 1808444
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Parameter Identification for Semiconductor Diodes by LBIC Imaging |
scientific article; zbMATH DE number 1808444 |
Statements
Parameter Identification for Semiconductor Diodes by LBIC Imaging (English)
0 references
29 September 2002
0 references
semiconductor diodes
0 references
laser-beam-induced-current imaging
0 references
drift-diffusion model
0 references
identification of parameters
0 references
least squares
0 references
differentiability
0 references
0.8367061018943787
0 references
0.8185706734657288
0 references
0.813075065612793
0 references
0.8090499043464661
0 references
0.7915599942207336
0 references
