Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors (Q5286311)
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scientific article; zbMATH DE number 223863
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| English | Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors |
scientific article; zbMATH DE number 223863 |
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Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors (English)
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29 June 1993
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nondestructive optical testing technique
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stationary basic semiconductor equations
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wellposedness of the model equations
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approximate model
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0.8224399089813232
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0.8185706734657288
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0.8147805333137512
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0.8017273545265198
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