Identifiability of Semiconductor Defects from LBIC Images (Q4037669)
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scientific article; zbMATH DE number 168985
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| English | Identifiability of Semiconductor Defects from LBIC Images |
scientific article; zbMATH DE number 168985 |
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Identifiability of Semiconductor Defects from LBIC Images (English)
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16 May 1993
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generation-recombination model
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drift-diffusion equations
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impurity doping profile
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laser-beam-induced current
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0.8090499043464661
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0.8007907867431641
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0.7478461861610413
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0.7401258945465088
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0.735905647277832
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