Influence of the analysis window on the metrological performance of the grid method (Q333624): Difference between revisions

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Revision as of 02:05, 20 March 2024

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Influence of the analysis window on the metrological performance of the grid method
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    Influence of the analysis window on the metrological performance of the grid method (English)
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    31 October 2016
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    image-based contactless measurement
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    displacement and strain maps
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    grid method
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    windowed Fourier analysis
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    spatially correlated noise
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    derivative of a random process
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    Wigner-ville transform
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