Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data (Q2463340): Difference between revisions
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Revision as of 01:29, 20 March 2024
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English | Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data |
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Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data (English)
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5 December 2007
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