Scalable Optimal Test Patterns for Crosstalk-induced Faults on Deep Submicron Global Interconnects (Q3614597): Difference between revisions
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Latest revision as of 01:19, 20 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Scalable Optimal Test Patterns for Crosstalk-induced Faults on Deep Submicron Global Interconnects |
scientific article |
Statements
Scalable Optimal Test Patterns for Crosstalk-induced Faults on Deep Submicron Global Interconnects (English)
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9 March 2009
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built-in self-test
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crosstalk faults
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DSM interconnects
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fault model
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test patterns
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