Q4367096 (Q4367096): Difference between revisions

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+Q5617282
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+Multiple-fault location of analog circuits
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+Q4132373
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+Automatic test generation techniques for analog circuits and systems: A review
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+On a theory of t-fault diagnosable analog systems
@@ Property / cites work: On a theory of t-fault diagnosable analog systems / rank @@
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+Node-fault diagnosis and a design of testability
@@ Property / cites work: Node-fault diagnosis and a design of testability / rank @@
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+Efficient fault analysis in linear analog circuits
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+A theory and an algorithm for analog circuit fault diagnosis
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+Diagnosability of linear active networks
@@ Property / cites work: Diagnosability of linear active networks / rank @@
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+Fault diagnosis for linear systems via multifrequency measurements
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+Multiport approach to multiple-fault location in analog circuits
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+Calculation of parameter values from node voltage measurements
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+On observability of discrete-event systems
@@ Property / cites work: On observability of discrete-event systems / rank @@
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+Observability of discrete event dynamic systems
@@ Property / cites work: Observability of discrete event dynamic systems / rank @@
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+Supervisory control of discrete-event processes with partial observations
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+Supervisory Control of a Class of Discrete Event Processes
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+Diagnosability of discrete event systems and its applications
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