Optimum step‐stress accelerated life test plans for log‐location‐scale distributions (Q5503764): Difference between revisions
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Latest revision as of 17:06, 30 December 2024
scientific article; zbMATH DE number 5493371
Language | Label | Description | Also known as |
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English | Optimum step‐stress accelerated life test plans for log‐location‐scale distributions |
scientific article; zbMATH DE number 5493371 |
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Optimum step‐stress accelerated life test plans for log‐location‐scale distributions (English)
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16 January 2009
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cumulative exposure model
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large-sample approximate variance
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maximum likelihood
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