Optimum step‐stress accelerated life test plans for log‐location‐scale distributions

DOI10.1002/nav.20299zbMath1152.62381MaRDI QIDQ5503764

William Q. Meeker, Haiming Ma

Publication date: 16 January 2009

Published in: Naval Research Logistics (NRL) (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/nav.20299

zbMATH Keywords

maximum likelihood; cumulative exposure model; large-sample approximate variance

Mathematics Subject Classification ID

62N05: Reliability and life testing

62A09: Graphical methods in statistics

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