scientific article; zbMATH DE number 151903
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Publication:4032001
DOI10.1002/1520-6750(199303)40:2%3C193::AID-NAV3220400205%3E3.0.CO;2-JzbMATH Open0765.62091MaRDI QIDQ4032001FDOQ4032001
Authors: Do Sun Bai, Myung-Soo Kim 
Publication date: 4 May 1993
Title of this publication is not available (Why is that?)
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- Optimum design for type-I step-stress accelerated life tests of two-parameter Weibull distributions
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- Optimum step‐stress accelerated life test plans for log‐location‐scale distributions
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- Optimal planning of failure-step stress partially accelerated life tests under type II censoring
Weibull distributionmaximum likelihood estimatornomographscumulative exposure modeltype I censoringeffect of changing stresslog-linear relationshipoptimum simple step-stress accelerated life testthree-level compromise plan
Cites Work
Cited In (31)
- Planning step-stress test plans under type-I hybrid censoring for the log-location-scale distribution
- Title not available (Why is that?)
- Bayesian order-restricted inference of a Weibull multi-step step-stress model
- Title not available (Why is that?)
- Optimal design of accelerated life tests under modified stress loading methods
- Optimal accelerated life tests under interval censoring with random removals: the case of Weibull failure distribution
- Optimum design of simple step-stress accelerated life tests under total type I and earlier type II
- Planning accelerated life tests for censored two-parameter exponential distributions
- Models Comparison for Step-Stress Accelerated Life Testing
- Designing Bayesian sampling plans for simple step-stress of accelerated life test on censored data
- Planning accelerated life tests for selecting the most reliable product
- Planning Accelerated Life Tests Under Progressive Type I Interval Censoring with Random Removals
- Optimal sample size allocation for multi-level stress testing with Weibull regression under Type-II censoring
- Analysis of simple step-stress model in presence of competing risks
- Optimal bivariate step-stress accelerated life test for type-I hybrid censored data
- Optimum step‐stress accelerated life test plans for log‐location‐scale distributions
- Optimum step-stress partially accelerated life tests for the truncated logistic distribution with censoring
- Optimal Robust Designs of Step-Stress Accelerated Life Testing Experiments for Proportional Hazards Models
- Planning step-stress test plans under Type-I censoring for the log-location-scale case
- Parametric inference for progressive type-I hybrid censored data on a simple step-stress accelerated life test model
- Optimal Allocation for Extreme Value Regression Under Time Censoring
- Optimal simple step stress accelerated life test design for reliability prediction
- Optimal planning of failure-step stress partially accelerated life tests under type II censoring
- Optimum design for type-I step-stress accelerated life tests of two-parameter Weibull distributions
- RETRACTED ARTICLE: Optimal planning of failure-step stress partially accelerated life tests under type-II censoring
- Designing efficient Bayesian sampling plans based on the simple step-stress test under random stress-change time for censored data
- Optimal designs for step-stress models under interval censoring
- Comparison between continuous and periodic inspections in step-stress tests
- Optimal sample size allocation for multi-level stress testing with exponential regression under type-I censoring
- Order restricted classical inference of a Weibull multiple step-stress model
- Design of bivariate accelerated life tests with one main effect and one interaction effect for log-location-scale distributions
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