scientific article; zbMATH DE number 2059656
From MaRDI portal
Publication:4457924
zbMATH Open1037.62105MaRDI QIDQ4457924FDOQ4457924
Authors: Yu Wang, Ruiyuan Liu 
Publication date: 17 March 2004
Title of this publication is not available (Why is that?)
Recommendations
- Optimum step‐stress accelerated life test plans for log‐location‐scale distributions
- scientific article; zbMATH DE number 5244065
- Optimum step-stress accelerated life tests of type I with multi-exponential distributions
- Planning step-stress test under type-I censoring for the exponential case
- Optimal design of step-stress accelerated life testing with progressive censoring
Cited In (28)
- Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor
- Planning step-stress accelerated life tests with two experimental factors for exponential distributions and type I censoring
- Analysis and optimum plan for 3-step step-stress accelerated life tests with Lomax model under progressive type-I censoring
- Investigation of a two-step accelerated life test for repairable systems
- Optimum design of simple step-stress accelerated life tests under total type I and earlier type II
- Optimal step-stress testing for progressively type-I censored data from exponential distribu\-tion
- Models Comparison for Step-Stress Accelerated Life Testing
- Title not available (Why is that?)
- Planning step‐stress life test with progressively type I group‐censored exponential data
- Optimal bivariate step-stress accelerated life test for type-I hybrid censored data
- Optimum step‐stress accelerated life test plans for log‐location‐scale distributions
- Title not available (Why is that?)
- Planning step-stress test under type-I censoring for the exponential case
- Optimum plan for step-stress model with progressive type-II censoring
- Optimum simple step-stress plans using reliability estimate
- A model for step-stress accelerated life testing
- Optimal simple step stress accelerated life test design for reliability prediction
- Optimal planning of failure-step stress partially accelerated life tests under type II censoring
- Optimal design of step-stress accelerated life testing with progressive censoring
- Optimal simple step-stress plan for type-I censored data from geometric distribution
- Optimum quadratic three-step stress plans for log-logistic distribution
- Optimum step-stress accelerated life tests of type I with multi-exponential distributions
- Optimal design of accelerated life tests under periodic inspection
- Title not available (Why is that?)
- Optimal plan for ordered step-stress stage life testing
- Title not available (Why is that?)
- Planning step-stress test plans under type-I censoring for the log-location-scale case
- Optimizing the simple step stress accelerated life test with Fréchet data
This page was built for publication:
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4457924)
