Optimal designs for step-stress models under interval censoring
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Publication:2321789
Recommendations
- Optimal design of step-stress accelerated life testing with progressive censoring
- Optimum partially accelerated life test plans with progressively type I interval-censored data
- Optimal progressive type-I interval censored scheme under step-stress life testing
- scientific article; zbMATH DE number 5244065
- Optimum design for type-I step-stress accelerated life tests of two-parameter Weibull distributions
Cites work
- scientific article; zbMATH DE number 151903 (Why is no real title available?)
- scientific article; zbMATH DE number 1198868 (Why is no real title available?)
- A tampered failure rate model for step-stress accelerated life test
- Accelerated Testing
- Asymptotic comparison between constant-stress testing and step-stress testing for type-I censored data from exponential distribution
- Bayesian analysis for step-stress accelerated life testing under progressive interval censoring
- Inference in step-stress models based on failure rates
- Optimal accelerated life tests under interval censoring with random removals: the case of Weibull failure distribution
- Optimal allocation of change points in simple step-stress experiments under type-II censoring
- Optimal step-stress test under type I progressive group-censoring with random removals
- Optimal step-stress testing for progressively type-I censored data from exponential distribu\-tion
- Optimum Accelerated Life Tests with a Nonconstant Scale Parameter
- Optimum M-step, step-stress design with K stress variables
- Optimum Simple Step-Stress Plans for Accelerated Life Testing
- Optimum design for type-I step-stress accelerated life tests of two-parameter Weibull distributions
- Optimum simple step-stress accelerated life tests with censoring
- Optimum step‐stress accelerated life test plans for log‐location‐scale distributions
- Planning Life Tests in Which Units Are Inspected for Failure
- Planning step-stress test plans under type-I censoring for the log-location-scale case
- The step-stress tampered failure rate model under interval monitoring
Cited in
(4)- OPTIMAL DESIGNS FOR FITTING A PROPORTIONAL HAZARDS REGRESSION MODEL TO DATA SUBJECT TO CENSORING
- Optimal design of inspection times for interval censoring
- Optimal allocation of change points in simple step-stress experiments under type-II censoring
- Optimum simple step-stress plan for log-logistic cumulative exposure model
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