Optimum step-stress partially accelerated life tests for the truncated logistic distribution with censoring

DOI10.1016/j.apm.2010.02.007zbMath1201.90066OpenAlexW2032178003MaRDI QIDQ611554

Neha Mittal, Preeti Wanti Srivastava

Publication date: 14 December 2010

Published in: Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.apm.2010.02.007

zbMATH Keywords

reliabilityasymptotic varianceacceleration factorpartially accelerated life teststep-stress test

Mathematics Subject Classification ID

Censored data models (62N01) Reliability, availability, maintenance, inspection in operations research (90B25) Testing in survival analysis and censored data (62N03) Reliability and life testing (62N05)

Related Items

ESTIMATING COSTS OF MAINTENANCE SERVICE POLICY USING STEP-STRESS PARTIALLY ACCELERATED LIFE TESTING FOR LINDLEY DISTRIBUTION UNDER TYPE II CENSORING ⋮ Parameter estimation for fractional diffusion process with discrete observations ⋮ Bayesian optimum accelerated life test plans based on quantile regression ⋮ Parameter estimation for fractional Ornstein-Uhlenbeck processes at discrete observation ⋮ Statistical inference for the Rayleigh distribution under progressively type-II censoring with binomial removal ⋮ Optimum Design for Type-I Step-stress Accelerated Life Tests of Two-parameter Weibull Distributions ⋮ Meta-analysis of general step-stress experiments under repeated type-II censoring ⋮ Local linear smoothing to estimate accelerated lifetime model with censoring and truncation ⋮ ESTIMATION AND OPTIMAL PLANS OF MULTIPLE RAMP-STRESS ACCELERATED LIFE TESTS FOR THE GENERALIZED HALF-NORMAL DISTRIBUTION ⋮ Inference on maintenance service policy under step-stress partially accelerated life tests using progressive censoring

Uses Software

• SPLIDA

Cites Work

• Unnamed Item
• Unnamed Item
• A tampered failure rate model for step-stress accelerated life test
• Bayesian estimation and optimal designs in partially accelerated life testing
• Accelerated Testing
• Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring
• THE MAXIMUM LIKELIHOOD ESTIMATES IN STEP PARTIALLY ACCELERATED LIFE TESTS FOR THE WEIBULL PARAMETERS IN CENSORED DATA