Optimum step-stress partially accelerated life tests for the truncated logistic distribution with censoring
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Cites work
- scientific article; zbMATH DE number 1198868 (Why is no real title available?)
- scientific article; zbMATH DE number 3436435 (Why is no real title available?)
- A tampered failure rate model for step-stress accelerated life test
- Accelerated Testing
- Bayesian estimation and optimal designs in partially accelerated life testing
- Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring
- THE MAXIMUM LIKELIHOOD ESTIMATES IN STEP PARTIALLY ACCELERATED LIFE TESTS FOR THE WEIBULL PARAMETERS IN CENSORED DATA
Cited in
(11)- Estimation and optimal plans of multiple ramp-stress accelerated life tests for the generalized half-normal distribution
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- Optimum design for type-I step-stress accelerated life tests of two-parameter Weibull distributions
- Statistical inference for the Rayleigh distribution under progressively type-II censoring with binomial removal
- Meta-analysis of general step-stress experiments under repeated type-II censoring
- Parameter estimation for fractional diffusion process with discrete observations
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- Estimating costs of maintenance service policy using step-stress partially accelerated life testing for Lindley distribution under type II censoring
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