Accelerated Testing
censored datamaximum likelihoodhazard functionoptimum test plansaccelerated testingleast squares approachOverstressmixed distributionscontaminated distributionsgraphical data analysislife testsaccelerated degradationseries-systemArrhenius life-relationshipscumulative exposuremultiple failure causesperformance of computing packagesPlotting methodsreal life examples
Reliability and life testing (62N05) Applications of statistics in engineering and industry; control charts (62P30) Graphical methods in statistics (62A09) Reliability, availability, maintenance, inspection in operations research (90B25) Research exposition (monographs, survey articles) pertaining to statistics (62-02)
- Inference on Nadarajah–Haghighi distribution with constant stress partially accelerated life tests under progressive type-II censoring
- Planning step-stress test plans under type-I censoring for the log-location-scale case
- Reliability model for dual constant-stress accelerated life test with Weibull distribution under Type-I censoring scheme
- Stochastic properties and parameter estimation for a general load-sharing system
- Acceptance Sampling Plans from Truncated Life Tests Based on the Generalized Birnbaum–Saunders Distribution
- Inference for a simple step-stress model based on ordered ranked set sampling
- On testing the fit of accelerated failure time and proportional hazard Weibull extension models
- A multirun step-stress model for trend renewal data with applications to lifetime assessment for rechargeable batteries
- On stochastic behaviors of load-sharing parallel systems
- Objective Bayesian analysis of degradation model with respect to a Wiener process
- Objective Bayesian analysis for the accelerated degradation model using Wiener process with measurement errors
- Analysis for partially accelerated dependent competing risks model with masked data based on copula function
- Scale tests for a multilevel step-stress model with exponential lifetimes under type-II censoring
- Multi-sample simple step-stress experiment under time constraints
- Exact inference for progressively type-I censored step-stress accelerated life test under interval monitoring
- scientific article; zbMATH DE number 7578257 (Why is no real title available?)
- The step-stress tampered failure rate model under interval monitoring
- AN ANALYSIS OF ACCELERATED PERFORMANCE DEGRADATION TESTS ASSUMING THE ARRHENIUS STRESS-RELATIONSHIP
- Optimal design of accelerated life testing plans for periodical replacement with penalty
- Exact inference for progressively type-I censored exponential failure data
- Optimal design of multiple constant-stress accelerated life testing for the extension of the exponential distribution under type-II censoring
- CS-PALT combined with different censoring techniques on Gompertz distribution: some inferences
- Planning step-stress test plans under type-I hybrid censoring for the log-location-scale distribution
- A Bayesian analysis of reliability in accelerated life tests using Gibbs sampler
- Misspecification analysis of gamma with inverse Gaussian degradation processes
- Inference of constant-stress accelerated life test for a truncated distribution under progressive censoring
- Prediction limits for the Weibull distribution utilizing simulation
- Geometry of the \(q\)-exponential distribution with dependent competing risks and accelerated life testing
- Objective Bayesian analysis accelerated degradation test based on Wiener process models
- Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring
- Inference for constant-stress accelerated degradation test based on gamma process
- Objective Bayesian analysis for the accelerated degradation model based on the inverse Gaussian process
- Degradation data analysis for samples under unequal operating conditions: a case study on train wheels
- Designing efficient Bayesian sampling plans for exponential distributions based on samples under a ( n , t ) simple step-stress test
- Step-stress accelerated degradation test planning based on Wiener process with correlation
- Bayesian acceptance sampling plan for simple step-stress model
- Estimation under failure-censored step-stress life test for the generalized exponential distribution parameters
- Analysis of simple step-stress accelerated life test data from Lindley distribution under type-I censoring
- Belief reliability: a new metrics for products' reliability
- Change-point detection of failure mechanism for electronic devices based on Arrhenius model
- On constant stress accelerated life tests terminated by type II censoring at one of the stress levels
- Degradation modeling applied to residual lifetime prediction using functional data analysis
- Exact inference for a simple step-stress model with competing risks for failure from exponential distribution under type-II censoring
- Minimal repair under a step-stress test
- A Life Test Procedure with Right Censored Data Based on the Wald–Wolfowitz Run Test
- Optimal step-stress test under type-I censoring for multivariate exponential distribution
- Estimating and planning accelerated life test using constant stress for generalized logistic distribution under type-I censoring
- A Bayesian framework for reliability assessment via Wiener process and MCMC
- Optimal allocation of change points in simple step-stress experiments under type-II censoring
- Analysis of progressively type-I interval censored competing risks data for a class of an exponential distribution
- Using BBPSO algorithm to estimate the Weibull parameters with censored data
- Bayesian estimation of exponentiated Weibull distribution under partially acceleration life tests
- scientific article; zbMATH DE number 1531996 (Why is no real title available?)
- Imprecise inference based on the log-rank test for accelerated life testing
- Conditions for the coincidence of the TFR, TRV and CE models
- Statistical analysis of middle censored competing risks data with exponential distribution
- On point prediction of new lifetimes under a simple step-stress model for censored Lomax data
- Bayesian inferences for an accelerated degradation model based on tweedie exponential dispersion process
- Statistical inference for a step-stress partially-accelerated life test model with an adaptive type-I progressively hybrid censored data from Weibull distribution
- Optimality and bias of some interpolation and extrapolation designs
- Inference of progressively type-II censored competing risks data from Chen distribution with an application
- Inference of accelerated dependent competing risks model for Marshall-Olkin bivariate Weibull distribution with nonconstant parameters
- On the optimal constant-stress acceleration based on competing risks with progressive type-II censoring for Lindley distribution
- Inferences in constant-partially accelerated life tests based on progressive type-II censoring
- Likelihood inference for a step-stress partially accelerated life test model with Type-I progressively hybrid censored data from Weibull distribution
- Estimating the parameters of Weibull distribution and the acceleration factor from hybrid partially accelerated life test
- Hybrid censoring: models, inferential results and applications
- Comments on: ``Virtual age, is it real? (Discussing virtual age in reliability context) by M. Finkelstein and J. H. Cha
- Modeling multivariate degradation processes with time-variant covariates and imperfect maintenance effects
- Rejoinder to: ``Virtual age, is it real?
- Virtual age, is it real? -- Discussing virtual age in reliability context
- Balancing load and performance for different failure models
- Classical and Bayesian estimations of improved Weibull-Weibull distribution for complete and censored failure times data
- The beta modified Weibull distribution
- A model for field failure prediction using dynamic environmental data
- Estimation in step-stress partially accelerated life tests for the Burr type XII distribution using type I censoring
- Expected termination times of progressively Type‐I censored step‐stress accelerated life tests under continuous and interval inspections
- Orthogonal parameters with censored data
- Semiparametric Models for Accelerated Destructive Degradation Test Data Analysis
- Bayesian Methods for Planning Accelerated Repeated Measures Degradation Tests
- Comparison between constant-stress and step-stress accelerated life tests under a cost constraint for progressive type I censoring
- Gamma degradation models: inference and optimal design
- On the collapsibility of lifetime regression models
- Inference for log‐location‐scale family of distributions under competing risks with progressive type‐I interval censored data
- On a double reparametrization for accelerated lifetime testing
- Applying locally optimal criterion for classifying highly-reliable products with a control
- Inference for a progressive stress model from Weibull distribution under progressive type-II censoring
- Inference on a new distribution under progressive-stress accelerated life tests and progressive type-II censoring based on a series-parallel system
- A reduced new modified Weibull distribution
- Optimal step-stress accelerated degradation test plans for inverse Gaussian process based on proportional degradation rate model
- Posterior analysis of lognormal regression models using the Gibbs sampler
- A sequential order statistics approach to step-stress testing
- Heterogeneous standby systems with shocks-driven preventive replacements
- Inference on progressive-stress model for the exponentiated exponential distribution under type-II progressive hybrid censoring
- Improved likelihood inference in Birnbaum-Saunders regressions
- Lifetime analysis based on the generalized Birnbaum-Saunders distribution
- Optimal step-stress testing for progressively type-I censored data from exponential distribu\-tion
- Inference for a simple step-stress model with competing risks for failure from the exponential distribution under time constraint
- Exponential progressive step-stress life-testing with link function based on Box-Cox transfor\-mation
- Exact inference for a simple step-stress model from the exponential distribution under time constraint
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