Gamma Degradation Models: Inference and Optimal Design

DOI10.1007/978-981-10-5194-4_9zbMath1402.62176OpenAlexW2752588936MaRDI QIDQ4559450

Chih-Chun Tsai, Chien-Tai Lin, Narayanaswamy Balakrishnan

Publication date: 3 December 2018

Published in: Statistical Modeling for Degradation Data (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/978-981-10-5194-4_9

zbMATH Keywords

degradation datagamma processaccelerated degradation testquality characteristicsburn-in testinspection and maintenancelifetime informationstep-stress accelerated degradation tests

Mathematics Subject Classification ID

Optimal statistical designs (62K05) Applications of statistics in engineering and industry; control charts (62P30) Reliability and life testing (62N05)

Uses Software

• SPLIDA

Cites Work

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• Accelerated Testing
• Determination of burn-in parameters and residual life for highly reliable products
• Using Degradation Measures to Estimate a Time-to-Failure Distribution
• Designing a screening experiment for highly reliable products
• An extension of the General Equivalence Theorem to nonlinear models
• Maximum Likelihood Estimation of Misspecified Models
• Models for Variable-Stress Accelerated Life Testing Experiments Based on Wiener Processes and the Inverse Gaussian Distribution

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