Reliability modeling of systems with two dependent degrading components based on gamma processes
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Publication:2811405
DOI10.1080/03610926.2013.870201zbMath1338.62197OpenAlexW2297571234MaRDI QIDQ2811405
Zhengqiang Pan, Jing Feng, Quan Sun
Publication date: 10 June 2016
Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610926.2013.870201
system reliabilitygamma processBirnbaum-Saunders distributionBayesian MCMC methoddependent degrading components
Processes with independent increments; Lévy processes (60G51) Bayesian inference (62F15) Applications of statistics in engineering and industry; control charts (62P30)
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