A review of accelerated test models
From MaRDI portal
Publication:2381752
DOI10.1214/088342306000000321zbMath1129.62090arXiv0708.0369OpenAlexW3098336475MaRDI QIDQ2381752
William Q. Meeker, Luis A. Escobar
Publication date: 18 September 2007
Published in: Statistical Science (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/0708.0369
reliabilityextrapolationdegradation datalifetime dataregression modelacceleration factorphotodegradationArrhenius relationshipEyring relationshipinverse power relationshipvoltage-stress acceleration
Applications of statistics in engineering and industry; control charts (62P30) Reliability and life testing (62N05)
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