Fiducial inference-based failure mechanism consistency analysis for accelerated life and degradation tests
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Publication:2109894
Cites work
- scientific article; zbMATH DE number 3860238 (Why is no real title available?)
- scientific article; zbMATH DE number 1198868 (Why is no real title available?)
- scientific article; zbMATH DE number 5586074 (Why is no real title available?)
- A new statistical inference method for multi-stress accelerated life testing based on random variable transformation
- A review of accelerated test models
- Change-point detection of failure mechanism for electronic devices based on Arrhenius model
- Degradation Modeling, Analysis, and Applications on Lifetime Prediction
- Degradation data analysis based on gamma process with random effects
- Degradation modeling with subpopulation heterogeneities based on the inverse Gaussian process
- Estimation of threshold stress in accelerated life-testing
- Fiducial Generalized Confidence Intervals
- Fiducial inference in the pivotal family of distributions
- Inference for constant-stress accelerated degradation test based on gamma process
- Modeling of degradation data via Wiener stochastic process based on acceleration factor constant principle
- On the hazard function of Birnbaum-Saunders distribution and associated inference
- Reference Bayesian analysis of inverse Gaussian degradation process
- Reliability and availability analysis of stochastic degradation systems based on bivariate Wiener processes
- The Percentile Points of Distributions Having Known Cumulants
- The functional-model basis of fiducial inference
- When is acceleration unnecessary in a degradation test?
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