An Accelerated Life Test Model Based on Reliability Kinetics

DOI10.2307/1269615zbMath0822.62083MaRDI QIDQ4842954

William Q. Meeker, Michael J. Luvale

Publication date: 16 August 1995

Full work available at URL: https://doi.org/10.2307/1269615

zbMATH Keywords

reliability; ordinary differential equations; censored data; likelihood-based methods; accelerated life tests; life data analysis; circuit boards; chemical kinetic model; conductive anodic filament failures; humidity-accelerated life test

Mathematics Subject Classification ID

92E20: Classical flows, reactions, etc. in chemistry

62N05: Reliability and life testing

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