Equivalent accelerated life testing plans for log-location-scale distributions

DOI10.1002/NAV.20415MaRDI QIDQ3580164zbMATH OpenOpenAlexFDO

Authors Haitao Liao, Elsayed A. Elsayed

Publication date 11 August 2010

Published in Naval Research Logistics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1002/nav.20415

zbMATH Keywords

type I censoringequivalencylog-location-scale distributionsoptimal ALT plans

Mathematics Subject Classification ID

Reliability and life testing (62N05) Reliability, availability, maintenance, inspection in operations research (90B25)

Recommendations

• Investigation of equivalent step-stress testing plans
• Statistical equivalency and optimality of simple step-stress accelerated test plans for the exponential distribution
• Design of accelerated life testing plans under multiple stresses
• Planning step-stress test plans under type-I censoring for the log-location-scale case
• Accelerated life test planning with independent lognormal competing risks

Cites work

• scientific article; zbMATH DE number 1198868 (Why is no real title available?)
• A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring
• A review of accelerated test models
• Accelerated Testing
• Accelerated life models: modeling and statistical analysis
• Asymptotically Optimum Over-Stress Tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability
• On Solving Nonlinear Equations with a One-Parameter Operator Imbedding
• Optimal Accelerated Life Designs for Estimation
• Optimal design of accelerated life tests under modified stress loading methods
• Optimum Accelerated Life Tests with a Nonconstant Scale Parameter
• Optimum Simple Step-Stress Plans for Accelerated Life Testing
• Optimum simple ramp-tests for the Weibull distribution and type-I censoring
• Optimum simple step-stress accelerated life tests with censoring
• Optimum simple step-stress accelerated life-tests with competing causes of failure
• Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions
• Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions

Cited in

(6)

• Inference for log‐location‐scale family of distributions under competing risks with progressive type‐I interval censored data
• Optimum step‐stress accelerated life test plans for log‐location‐scale distributions
• Optimum step-stress accelerated degradation test for Wiener degradation process under constraints
• Investigation of equivalent step-stress testing plans
• Design of accelerated life testing plans under multiple stresses
• Accelerated life test planning with independent lognormal competing risks

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