Equivalent accelerated life testing plans for log-location-scale distributions
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Publication:3580164
DOI10.1002/NAV.20415zbMATH Open1303.62054OpenAlexW2112017961MaRDI QIDQ3580164FDOQ3580164
Authors: Haitao Liao, Elsayed A. Elsayed 
Publication date: 11 August 2010
Published in: Naval Research Logistics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/nav.20415
Recommendations
- Investigation of equivalent step-stress testing plans
- Statistical equivalency and optimality of simple step-stress accelerated test plans for the exponential distribution
- Design of accelerated life testing plans under multiple stresses
- Planning step-stress test plans under type-I censoring for the log-location-scale case
- Accelerated life test planning with independent lognormal competing risks
Reliability and life testing (62N05) Reliability, availability, maintenance, inspection in operations research (90B25)
Cites Work
- Title not available (Why is that?)
- On Solving Nonlinear Equations with a One-Parameter Operator Imbedding
- Accelerated Testing
- Accelerated life models: modeling and statistical analysis
- Optimum simple step-stress accelerated life tests with censoring
- Optimum Simple Step-Stress Plans for Accelerated Life Testing
- Optimum simple step-stress accelerated life-tests with competing causes of failure
- Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
- Optimum Accelerated Life Tests with a Nonconstant Scale Parameter
- Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions
- Optimum simple ramp-tests for the Weibull distribution and type-I censoring
- A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring
- A review of accelerated test models
- Asymptotically Optimum Over-Stress Tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability
- Optimal Accelerated Life Designs for Estimation
- Optimal design of accelerated life tests under modified stress loading methods
Cited In (6)
- Inference for log‐location‐scale family of distributions under competing risks with progressive type‐I interval censored data
- Optimum step‐stress accelerated life test plans for log‐location‐scale distributions
- Optimum step-stress accelerated degradation test for Wiener degradation process under constraints
- Investigation of equivalent step-stress testing plans
- Design of accelerated life testing plans under multiple stresses
- Accelerated life test planning with independent lognormal competing risks
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