Accelerated life test planning with independent lognormal competing risks
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Publication:2655071
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Cites work
- A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring
- Accelerated Testing
- An extension of the General Equivalence Theorem to nonlinear models
- Bayesian design for accelerated life testing
- Competing failure modes in accelerated life testing
- scientific article; zbMATH DE number 3677042 (Why is no real title available?)
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- Optimal Bayesian design applied to logistic regression experiments
- Optimum simple step-stress accelerated life-tests with competing causes of failure
- The Equivalence of Two Extremum Problems
- Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions
- Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
Cited in
(17)- Inference of progressively censored competing risks data from Kumaraswamy distributions
- Analysis of dependent left-truncated and right-censored competing risks data with partially observed failure causes
- Bayesian accelerated life test plans for series systems with Weibull component lifetimes
- How do heterogeneities in operating environments affect field failure predictions and test planning?
- Competing failure modes in accelerated life testing
- Planning Accelerated Life Tests with Two or More Experimental Factors
- Equivalent accelerated life testing plans for log-location-scale distributions
- Design of accelerated life testing plans under multiple stresses
- Use-level lifetime distribution estimation under dependent right censored test data
- Optimal planning of progressively Type-I censored step-stress accelerated life test under interval inspection
- Bayesian optimum accelerated life test plans based on quantile regression
- Optimal sample size allocation for accelerated life test under progressive type-II censoring with competing risks
- Bayesian D-optimal accelerated life test plans for series systems with competing exponential causes of failure
- Inference for log‐location‐scale family of distributions under competing risks with progressive type‐I interval censored data
- Statistical inference for the step-stress model with competing risks from the Kumaraswamy distribution under progressive type-II censoring
- Analysis for left-truncated and right-censored competing risks data from Marshall-Olkin bivariate generalized lifetime family
- Bayesian accelerated life testing under competing log-location-scale family of causes of failure
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