A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring
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Publication:3341722
DOI10.2307/1268110zbMath0549.62067OpenAlexW4255498299MaRDI QIDQ3341722
Publication date: 1984
Full work available at URL: https://doi.org/10.2307/1268110
robustnessreliabilitynumerical comparisonslognormal distributionscensored dataexperimental designaccelerated life testsWeibull distributionsoptimum testlarge sample properties of maximum likelihood estimators
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On minimax designs when there are two candidate models ⋮ Planning accelerated life tests with type II censored data ⋮ Accelerated life test planning with independent lognormal competing risks ⋮ Robust estimation based on one-shot device test data under log-normal lifetimes ⋮ Optimal design of accelerated degradation tests based on Wiener process models ⋮ Planning Accelerated Life Tests Under Progressive Type I Interval Censoring with Random Removals ⋮ Bayesian design for accelerated life testing ⋮ Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor ⋮ Equivalent accelerated life testing plans for log-location-scale distributions ⋮ Optimal design of accelerated life testing plans for periodical replacement with penalty ⋮ A dynamic bayesian approach to inference from accelerated life tests
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