Optimal design of accelerated degradation tests based on Wiener process models
From MaRDI portal
Publication:5124762
DOI10.1080/02664760903406488MaRDI QIDQ5124762
Publication date: 30 September 2020
Published in: Journal of Applied Statistics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/02664760903406488
reliability; Wiener process; maximum-likelihood estimation; accelerated degradation test; optimal test plan
62-XX: Statistics
Related Items
A Survey of Modeling and Application of Non-destructive and Destructive Degradation Tests, Optimal Designs for LED Degradation Modeling, Unnamed Item, Nonparametric optimal designs for degradation tests, Bayesian Estimation for Bivariate Gamma Processes with Copula, A doubly accelerated degradation model based on the inverse Gaussian process and its objective Bayesian analysis, Optimal design for constant-stress accelerated degradation test based on gamma process, Multi-objective optimization design of accelerated degradation test based on Wiener process, Mis-specification analysis of the impact of covariates on the diffusion coefficient in Wiener degradation process, Step-stress accelerated degradation test planning based on Wiener process with correlation, Mis-specification analyses and optimum degradation test plan for Wiener and inverse Gaussian processes, Global planning of accelerated degradation tests based on exponential dispersion degradation models, Profile optimum planning for degradation analysis, Objective Bayesian analysis of accelerated degradation models based on Wiener process with correlation, Optimization of the accelerated degradation test plan for electrical connector contact pairs based on a nonlinear Wiener process, Degradation data analysis and remaining useful life estimation: a review on Wiener-process-based methods, Accelerated degradation process analysis based on the nonlinear Wiener process with covariates and random effects, Analytical approach for designing accelerated degradation tests under an exponential dispersion model, Reliability estimation from two types of accelerated testing data based on an artificial neural network supported Wiener process, Reliability testing for product return prediction, Inverse Gaussian process based reliability analysis for constant-stress accelerated degradation data, A time-discrete and zero-adjusted gamma process model with application to degradation analysis, Modeling of degradation data via Wiener stochastic process based on acceleration factor constant principle, Optimal plan for Wiener constant-stress accelerated degradation model, Inference for constant-stress accelerated degradation test based on gamma process, Optimum step-stress accelerated degradation test for Wiener degradation process under constraints
Uses Software
Cites Work
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Failure inference from a marker process based on a bivariate Wiener model
- Modelling accelerated degradation data using Wiener diffusion with a time scale transformation
- Accelerated test models with the inverse Gaussian distribution
- Inference from accelerated degradation and failure data based on Gaussian process models
- Estimating degradation by a Wiener diffusion process subject to measurement error
- Designing an accelerated degradation experiment with a reciprocal Weibull degradation rate
- A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring
- Accelerated Testing
- Bayesian analysis for inverse gaussian lifetime data with measures of degradation
- Experimental Design for a Class of Accelerated Degradation Tests
- Using Degradation Measures to Estimate a Time-to-Failure Distribution
- Models for Variable-Stress Accelerated Life Testing Experiments Based on Wiener Processes and the Inverse Gaussian Distribution