Accelerated test models with the inverse Gaussian distribution

DOI10.1016/S0378-3758(99)00214-1zbMATH Open0954.62121OpenAlexW2044623812WikidataQ127220100 ScholiaQ127220100MaRDI QIDQ1582364FDOQ1582364

Authors: W. J. Padgett, Arzu Onar 

Publication date: 3 October 2000

Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/s0378-3758(99)00214-1

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zbMATH Keywords

percentilesFisher informationsize effectcumulative damagestrength distributions

Mathematics Subject Classification ID

Reliability and life testing (62N05) Testing in survival analysis and censored data (62N03)

Cites Work

• Title not available (Why is that?)
• Cumulative Damage Models for System Failure with Application to Carbon Fibers and Composites
• Fatigue Failure Models ߝ Birnbaum-Saunders vs. Inverse Gaussian
• Stochastic models of failure in random environments
• Title not available (Why is that?)
• The Inverse Gaussian Distribution as a Lifetime Model
• Accelerated test models for system strength based on Birnbaum-Saunders distributions
• Title not available (Why is that?)
• Title not available (Why is that?)

Cited In (17)

• A bootstrap control chart for inverse Gaussian percentiles
• Burr type-XII percentile control charts
• Score and Wald tests for the homogeneity of inverse Gaussian scale parameters based on computational approach test
• A general class of cumulative damage models for materials failure
• Multiple-steps step-stress accelerated degradation modeling based on Wiener and gamma processes
• Optimal design of accelerated degradation tests based on Wiener process models
• Optimum test planning for heterogeneous inverse Gaussian processes
• A penalized local D-optimality approach to design for accelerated test models
• Birnbaum‐Saunders distribution: A review of models, analysis, and applications
• A Bayes study of inverse Gaussian based strength models with accelerating stress
• Bivariate degradation analysis of products based on Wiener processes and copulas
• Title not available (Why is that?)
• Inverse gaussian accelerated test models based on cumulative damage
• Control charts for monitoring Burr type-X percentiles
• Accelerated Testing
• Optimal designs for LED degradation modeling
• Accelerated degradation process analysis based on the nonlinear Wiener process with covariates and random effects

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