Optimal designs for LED degradation modeling
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Publication:4559449
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Cites work
- scientific article; zbMATH DE number 1198868 (Why is no real title available?)
- scientific article; zbMATH DE number 3240796 (Why is no real title available?)
- A note on optimal allocations for the second elementary symmetric function with applications for optimal reliability design
- A penalized local D-optimality approach to design for accelerated test models
- A review of accelerated test models
- Accelerated degradation models for failure based on geometric Brownian motion and gamma processes
- Accelerated test models with the inverse Gaussian distribution
- Covariates and random effects in a Gamma process model with application to degradation and failure
- Inference from accelerated degradation and failure data based on Gaussian process models
- Multiple-steps step-stress accelerated degradation modeling based on Wiener and gamma processes
- Optimal design of accelerated degradation tests based on Wiener process models
- Optimum Simple Step-Stress Plans for Accelerated Life Testing
- Properties of the Weibull cumulative exposure model
- Using Degradation Measures to Estimate a Time-to-Failure Distribution
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