Optimal designs for LED degradation modeling

DOI10.1007/978-981-10-5194-4_8zbMATH Open1402.62357OpenAlexW2753200922MaRDI QIDQ4559449FDOQ4559449

Authors: Tzong-Ru Tsai, Nan Jiang, Hon Keung Tony Ng, Ding-Geng (Din) Chen, Yuhlong Lio 

Publication date: 3 December 2018

Published in: Statistical Modeling for Degradation Data (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/978-981-10-5194-4_8

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zbMATH Keywords

Wiener processgamma processFisher informationinverse Gaussian distributioncumulative exposure modellifetime information

Mathematics Subject Classification ID

Statistical aspects of information-theoretic topics (62B10) Reliability and life testing (62N05) Applications of statistics in engineering and industry; control charts (62P30)

Cites Work

• Title not available (Why is that?)
• Title not available (Why is that?)
• Using Degradation Measures to Estimate a Time-to-Failure Distribution
• Covariates and random effects in a Gamma process model with application to degradation and failure
• Accelerated degradation models for failure based on geometric Brownian motion and gamma processes
• Optimum Simple Step-Stress Plans for Accelerated Life Testing
• A penalized local D-optimality approach to design for accelerated test models
• Inference from accelerated degradation and failure data based on Gaussian process models
• Optimal design of accelerated degradation tests based on Wiener process models
• A note on optimal allocations for the second elementary symmetric function with applications for optimal reliability design
• A review of accelerated test models
• Accelerated test models with the inverse Gaussian distribution
• Multiple-steps step-stress accelerated degradation modeling based on Wiener and gamma processes
• Properties of the Weibull cumulative exposure model

Cited In (3)

• Optimal plan for Wiener constant-stress accelerated degradation model
• High-Power LED Luminous Flux Estimation Using a Mathematical Model Incorporating the Effects of Heatsink and Fins
• Experimental Design for a Class of Accelerated Degradation Tests

Uses Software

• SPLIDA

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