scientific article; zbMATH DE number 1121370

zbMATH Open0886.62090MaRDI QIDQ4378128FDOQ4378128

Sheng-Tsaing Tseng, Hong-Fwu Yu

Publication date: 10 May 1998

Title of this publication is not available (Why is that?)

Recommendations

• Reliability inference for field conditions from accelerated degradation testing
• Optimal designs for LED degradation modeling
• Global planning of accelerated degradation tests based on exponential dispersion degradation models
• Designing an accelerated degradation experiment with a reciprocal Weibull degradation rate

zbMATH Keywords

termination timeADTaccelerated degradation testinghighly reliable productdegradation path

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Cited In (9)

• Degradation modeling applied to residual lifetime prediction using functional data analysis
• Degradation data analysis and remaining useful life estimation: a review on Wiener-process-based methods
• Designing an accelerated degradation experiment with a reciprocal Weibull degradation rate
• Mis-specification analyses and optimum degradation test plan for Wiener and inverse Gaussian processes
• Reliability inference for field conditions from accelerated degradation testing
• Optimum step-stress accelerated degradation test for Wiener degradation process under constraints
• Degradation Test Plan for a Nonlinear Random-Coefficients Model
• Methods for planning repeated measures accelerated degradation tests
• Experimental Design for a Class of Accelerated Degradation Tests

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