scientific article; zbMATH DE number 1121370
From MaRDI portal
Publication:4378128
Recommendations
- Reliability inference for field conditions from accelerated degradation testing
- Optimal designs for LED degradation modeling
- Global planning of accelerated degradation tests based on exponential dispersion degradation models
- Designing an accelerated degradation experiment with a reciprocal Weibull degradation rate
Cited in
(11)- Experimental Design for a Class of Accelerated Degradation Tests
- Degradation modeling applied to residual lifetime prediction using functional data analysis
- Degradation data analysis and remaining useful life estimation: a review on Wiener-process-based methods
- Degradation test plan for a nonlinear random-coefficients model
- Designing an accelerated degradation experiment with a reciprocal Weibull degradation rate
- Mis-specification analyses and optimum degradation test plan for Wiener and inverse Gaussian processes
- Reliability demonstration through accelerated degradation zero-failure testing under binomial distributions
- Reliability inference for field conditions from accelerated degradation testing
- Optimum step-stress accelerated degradation test for Wiener degradation process under constraints
- Optimal designs for LED degradation modeling
- Methods for planning repeated measures accelerated degradation tests
This page was built for publication:
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4378128)
