A dynamic bayesian approach to inference from accelerated life tests

DOI10.1080/03610919908813534MaRDI QIDQ4240798zbMATHOpenAlexFDO

Authors Lii-Yuh Leu, Ji-Cheng Wu

Publication date 7 July 1999

Published in Communications in Statistics. Simulation and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/03610919908813534

zbMATH Keywords

tablesBayes estimatorfailure rateaccelerated life testpiecewise exponential distributiondynamic Bayesian models

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

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Cites work

• scientific article; zbMATH DE number 4113806 (Why is no real title available?)
• A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring
• A Kalman-Filter Smoothing Approach for Extrapolations in Certain Dose-Response, Damage-Assessment, and Accelerated-Life-Testing Studies
• A New Approach To Inference From Accelerated Life Tests
• A Nonparametric Approach to Accelerated Life Testing
• A nonparametric approach to progressive stress accelerated life testing
• Accelerated Testing
• Dynamic Generalized Linear Models and Bayesian Forecasting
• Estimation from Accelerated Life Tests
• Inference for step-stress accelerated life tests
• Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions
• Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions

Cited in

(7)

• scientific article; zbMATH DE number 4003317 (Why is no real title available?)
• scientific article; zbMATH DE number 79248 (Why is no real title available?)
• scientific article; zbMATH DE number 4113806 (Why is no real title available?)
• Bayesian Estimation of the Parameters, Reliability and Hazard Rate Functions of Mixtures Under Accelerated Life Tests
• Bayesian Analysis of Different Hybrid and Progressive Life Tests
• Accelerated life testing for double-truncated general half normal distribution
• Bayesian inference under ramp stress accelerated life testing using Stan

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