Optimum simple ramp-tests for the Weibull distribution and type-I censoring

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Publication:4015213

DOI10.1109/24.159808zbMath0749.62064OpenAlexW2138373948MaRDI QIDQ4015213

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Publication date: 14 December 1992

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/24.159808




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