A Bayesian Approach for Step-Stress-Accelerated Life Tests for One-Shot Devices Under Exponential Distributions

DOI10.1007/978-3-030-88658-5_1OpenAlexW4302440865MaRDI QIDQ5051085

Xuwen Hu, Man Ho Ling

Publication date: 18 November 2022

Published in: Emerging Topics in Statistics and Biostatistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/978-3-030-88658-5_1

Mathematics Subject Classification ID

Applications of statistics to biology and medical sciences; meta analysis (62P10) Bayesian inference (62F15) Reliability and life testing (62N05)

Cites Work

• Bayesian reliability
• Statistical decision theory and Bayesian analysis. 2nd ed
• A review of accelerated test models
• Simulation-Based Inspection Policies for a One-Shot System in Storage Over a Finite Time Span
• The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing
• A tampered failure rate model for step-stress accelerated life test
• The EM Algorithm and Extensions, 2E
• Bayesian estimation and optimal designs in partially accelerated life testing
• Accelerated Life Testing - Step-Stress Models and Data Analyses
• OPTIMAL DESIGN OF SIMPLE STEP-STRESS ACCELERATED LIFE TESTS FOR ONE-SHOT DEVICES UNDER EXPONENTIAL DISTRIBUTIONS
• A hierarchical Bayes analysis for one-shot device testing experiment under the assumption of exponentiality
• Equation of State Calculations by Fast Computing Machines
• Monte Carlo sampling methods using Markov chains and their applications

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