A hierarchical Bayes analysis for one-shot device testing experiment under the assumption of exponentiality

DOI10.1080/03610918.2017.1310233MaRDI QIDQ5084917zbMATH OpenOpenAlexFDO

Authors

Publication date 29 June 2022

Published in Communications in Statistics. Simulation and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/03610918.2017.1310233

zbMATH Keywords

Cox proportional hazards modelexponential distributionGibbs-Metropolis hybridizationhierarchical Bayes analysismissing data

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

Cites work

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• Sampling-Based Approaches to Calculating Marginal Densities
• The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing
• The Effect of Improper Priors on Gibbs Sampling in Hierarchical Linear Mixed Models
• Understanding computational Bayesian statistics

Cited in

(2)

• A Bayesian Approach for Step-Stress-Accelerated Life Tests for One-Shot Devices Under Exponential Distributions
• Determination of warranty length for one-shot devices with Rayleigh lifetime distribution

Describes a project that uses

Uses Software

• Bolstad2
• SPLIDA

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