A hierarchical Bayes analysis for one-shot device testing experiment under the assumption of exponentiality

DOI10.1080/03610918.2017.1310233OpenAlexW2599178840MaRDI QIDQ5084917

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Publication date: 29 June 2022

Published in: Communications in Statistics - Simulation and Computation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610918.2017.1310233

zbMATH Keywords

exponential distributionmissing dataCox proportional hazards modelhierarchical Bayes analysisGibbs-Metropolis hybridization

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

Related Items (2)

A Bayesian Approach for Step-Stress-Accelerated Life Tests for One-Shot Devices Under Exponential Distributions ⋮ Determination of warranty length for one-shot devices with Rayleigh lifetime distribution

Uses Software

• Bolstad2
• SPLIDA

Cites Work

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• Bayesian proportional hazards model for current status data with monotone splines
• Bayesian modeling of bathtub shaped hazard rate using various Weibull extensions and related issues of model selection
• A review of accelerated test models
• Bayesian Models for Multivariate Current Status Data with Informative Censoring
• The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing
• Sampling-Based Approaches to Calculating Marginal Densities
• The Effect of Improper Priors on Gibbs Sampling in Hierarchical Linear Mixed Models
• Adaptive Rejection Sampling for Gibbs Sampling

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