The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing

DOI10.1080/00949650802142592MaRDI QIDQ3401367zbMATH OpenOpenAlexFDO

Authors

Publication date 29 January 2010

Published in Journal of Statistical Computation and Simulation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/00949650802142592

zbMATH Keywords

censoringprior distributionsMarkov chain Monte Carlo methodfailure rateposterior distributionsBayesian approachexponential distributionshigh reliabilitylife timeMetropolis-Hasting's alrogithm

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05) Applications of statistics in engineering and industry; control charts (62P30) Monte Carlo methods (65C05)

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Cites work

• scientific article; zbMATH DE number 1198868 (Why is no real title available?)
• scientific article; zbMATH DE number 699423 (Why is no real title available?)
• scientific article; zbMATH DE number 775283 (Why is no real title available?)
• scientific article; zbMATH DE number 3390199 (Why is no real title available?)
• Monte Carlo sampling methods using Markov chains and their applications
• Statistical decision theory and Bayesian analysis. 2nd ed
• comparing several accelerated life models

Cited in

(11)

• Determination of warranty length for one-shot devices with Rayleigh lifetime distribution
• A Bayesian Approach for the Analysis of Tumorigenicity Data from Sacrificial Experiments Under Weibull Lifetimes
• Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks
• OPTIMAL DESIGN OF SIMPLE STEP-STRESS ACCELERATED LIFE TESTS FOR ONE-SHOT DEVICES UNDER EXPONENTIAL DISTRIBUTIONS
• A Bayesian Approach for Step-Stress-Accelerated Life Tests for One-Shot Devices Under Exponential Distributions
• A hierarchical Bayes analysis for one-shot device testing experiment under the assumption of exponentiality
• The synthetically analytical method for data sets on pyrotechnics reliability tests
• Analysis of non-repairable cold-standby systems in Bayes theory
• On the choice of the optimal tuning parameter in robust one-shot device testing analysis
• Copula models for one-shot device testing data with correlated failure modes
• Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data

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