Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks
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Publication:6049270
DOI10.1016/j.cam.2023.115452zbMath1522.62092MaRDI QIDQ6049270
Elena Castilla, Narayanaswamy Balakrishnan
Publication date: 17 October 2023
Published in: Journal of Computational and Applied Mathematics (Search for Journal in Brave)
Robustness and adaptive procedures (parametric inference) (62F35) Reliability and life testing (62N05)
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